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小明 asked in 社會與文化語言 · 8 years ago

請幫忙翻意英文句子...

請幫忙翻譯以下句子

1.在輸出短路的條件下有可能會造成MOSFET(switch)損壞,

我們將檢討此問題並做為以後開發機種的改善方針

2.開發階段所做的短路試驗都是以電子負載來做測試,但是由於電子負載本身有限流Function ,所以一直沒有發現Q201 or Q401 damage 發生

3.要求工程師在做短路保護Function 測試時,必須確實搭配系統做短路試驗,避免使用DC load 造成誤判

4.以後開發的機種針對每一顆MOS功率半導體元件必須驗證在abnormal 條件下的SOA

5.為何MOSFET會損壞

2 Answers

Rating
  • 秀珍
    Lv 5
    8 years ago
    Favorite Answer

    1.在輸出短路的條件下有可能會造成MOSFET(switch)損壞,

    我們將檢討此問題並做為以後開發機種的改善方針

    In output shortcut circumstances, It could cause MOSFET(switch) broken.

    We will deal with this problem and make adjustment in future machine types.

    2.開發階段所做的短路試驗都是以電子負載來做測試,但是由於電子負載本身有限流Function ,所以一直沒有發現Q201 or Q401 damage 發生

    Under the shortcut test of development stage, we use electricity load, but due to the electricity limited function of the load, we never find Q201 or Q401 damage.

    3.要求工程師在做短路保護Function 測試時,必須確實搭配系統做短路試驗,避免使用DC load 造成誤判

    We require engineers to do shortcut test under proper system in order to avoid the mistake on DC load while testing the shortcut protection function.

    4.以後開發的機種針對每一顆MOS功率半導體元件必須驗證在abnormal 條件下的SOA

    Every future MOS rate semi-conductor part must validate SOA under abnormal condition.

    5.為何MOSFET會損壞

    Why does MOSFET broke?

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  • James
    Lv 5
    8 years ago

    1.在輸出短路的條件下有可能會造成MOSFET(switch)損壞,

    我們將檢討此問題並做為以後開發機種的改善方針

    In the event of an output short-circuit, the MOSFET (switch) may be damaged. This issue will be researched and will serve as a guide in the development of future models.

    2.開發階段所做的短路試驗都是以電子負載來做測試,但是由於電子負載本身有限流Function ,所以一直沒有發現Q201 or Q401 damage 發生

    Because electronic loads, used in short-circuit tests during the development stage, have a current limiting function, we have not noticed the Q201 or Q401 damages.

    3.要求工程師在做短路保護Function 測試時,必須確實搭配系統做短路試驗,避免使用DC load 造成誤判

    Engineers should be required to perform short-circuit protection function tests in a system environment and to avoid using DC loads, which may result in misreading.

    4.以後開發的機種針對每一顆MOS功率半導體元件必須驗證在abnormal 條件下的SOA

    For future models, the SOA of each MOS semiconductor component working under abnormal conditions will have to be individually verified.

    5.為何MOSFET會損壞

    What may have caused MOSFET to be damaged?

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